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Evolving wireless technologies like 802.11ax and 5G to increasing DC and analog IC integration, the challenges of RFIC and mixed-signal test continue to escalate. Learn about the test implications of these emerging technologies and how you can reduce your characterization and final manufacturing test costs and time to market with a smarter approach to test.
Who Should Attend?
This event is intended for engineers and managers involved with the characterization and final production test of RFICs, DC and mixed signal components.
About National Instruments
Since 1976, NI (www.ni.com) has made it possible for engineers and scientists to solve the world’s greatest engineering challenges with powerful platform-based systems that accelerate productivity and drive rapid innovation. Customers from a wide variety of industries – from healthcare to automotive and consumer electronics to particle physics – use NI’s integrated hardware and software platform to improve the world we live in.
National Instruments is the Global Leader in Test, Measurement and Control Solution.
Event Details
Agenda:

       Welcome note by IESA & National Instruments

       Panel Discussion on - “Bespoke Testers or One for All. What to Adopt?”

      “Leveraging a Common Platform for Bench-top Measurements to Production Test”

Abstract - Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need scalable solutions that address cost, design, and device challenges. A platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test. This session will take a deep dive into how a single platform can scale up from ease of bench top measurements all the way up to high throughput production scale test system.
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